NIST - National Institute of Standards and Technology
12/02/2025 | Press release | Archived content
Selecting the complexity of the Moore-Penrose pseudoinverse for emission ghost imaging
Published
December 2, 2025
Author(s)
Kevin Coakley, Huaiyu Chen-Mayer, Bruce Ravel, Daniel Josell, Nikolai Klimov, Daniel Hussey
Abstract
We reconstruct X-ray fluorescence signals produced by synchrotron X-rays. In our method, we select the complexity of a Moore-Penrose pseudoinverse by a data-driven method, and study how systematic errors affect results for simulated data.
Proceedings Title
Optica Imaging Congress 2025 (3D,DH,COSI,IS,pcaOP,RadIT)
Conference Dates
August 18-21, 2025
Conference Location
Seattle, WA, US
Conference Title
Optical Imaging Congress 2025
Pub Type
Conferences
Keywords
Cross-validation, experimental data, Moore-Penrose pseudoinverse, ghost imaging, simulations, synchrotron, X-rays, X-ray fluorescence.
Citation
Coakley, K. , Chen-Mayer, H. , Ravel, B. , Josell, D. , Klimov, N. and Hussey, D. (2025), Selecting the complexity of the Moore-Penrose pseudoinverse for emission ghost imaging, Optica Imaging Congress 2025 (3D,DH,COSI,IS,pcaOP,RadIT), Seattle, WA, US (Accessed December 4, 2025)
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