NIST - National Institute of Standards and Technology
04/27/2026 | Press release | Archived content
Bootstrap Metric for Quantifying the Depth Resolution of 3D Sensors
Published
April 27, 2026
Author(s)
Prem Rachakonda, Hariharan Iyer, Marek Franaszek, Kamel Saidi
Abstract
Depth resolution of a 3D imaging system or 3D sensor is defined as the smallest change in physical depth that causes a detectable change in the corresponding measured or derived depth. The ability of a sensor to resolve depth on a particular target is correlated with the sensor noise on that target. This work presents a novel metric for calculating the depth resolution of a 3D sensor.
Proceedings Title
Proceedings of the 2026 SPIE Defense + Security Conference
Conference Dates
April 26-30, 2026
Conference Location
National Harbor, MD, US
Conference Title
2026 SPIE Defense + Security Conference
Pub Type
Conferences
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Keywords
3D imaging systems, sensor parameters, depth resolution, Bootstrapping, standards, ASTM E57
Citation
Rachakonda, P. , Iyer, H. , Franaszek, M. and Saidi, K. (2026), Bootstrap Metric for Quantifying the Depth Resolution of 3D Sensors, Proceedings of the 2026 SPIE Defense + Security Conference, National Harbor, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=961663 (Accessed April 30, 2026)
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NIST - National Institute of Standards and Technology published this content on April 27, 2026, and is solely responsible for the information contained herein. Distributed via Public Technologies (PUBT), unedited and unaltered, on April 30, 2026 at 09:16 UTC. If you believe the information included in the content is inaccurate or outdated and requires editing or removal, please contact us at [email protected]